Field effect transistor having an improved transistor characteristic
US5466955A · kind A · utility
3Cited by
1References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 30, 1995 |
| Grant date | Nov 14, 1995 |
| Priority date | — |
| Expiry date | Jan 30, 2015 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D30/4732
Abstract
A field effect transistor (20) comprises a first semiconductor layer (24) and a second semiconductor layer (25) formed on the first semiconductor layer. The first semiconductor layer is an undoped layer and is composed of InGaAs. The second semiconductor layer is composed of InAlGaP and is a doped layer in which an n-type impurity is doped. A heterojunction structure is formed between the first semiconductor layer and the second semiconductor layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.