Apparatus and method for the analysis of particle characteristics using monotonically scattered light
US5471299A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 29, 1994 |
| Grant date | Nov 28, 1995 |
| Priority date | — |
| Expiry date | Jul 29, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/4714
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for the analysis of individual particle characteristics from an aerosol or other suspension of particles, of the type having a scattering chamber (15) with an ellipsoidal reflector (17) and an orifice leading to a rear chamber (20), and a monochromatic light source (10) adapted to transmit a collimated beam of light (11) along the main axis of the reflector (17) to impinge on a stream of the particles reflector (17), has an optical system (17, 32, 33, 34) arranged to collect light back-scattered from a particle, through a solid angle of at least 3.pi., pass the light to a a ccd video recorder (36) having a two dimensional array of a multitude of sensors. The recorder (36) is associated with a data processor (37) and with an imaging screen (35) positioned such that rays of light scattered from the particle and imaged thereon by the optical system (17, 32, 33, 34) are monotonically ordered with respect to the angle of scattering of the rays from the particle.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.