Patent · US Expired

Magnetic inspection probe for measurement of magnetic anisotropy

US5475305A · kind A · utility

4Cited by
24References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 18, 1993
Grant dateDec 12, 1995
Priority date
Expiry dateFeb 18, 2013

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R33/12
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A magnetic inspection probe for use in the planar measurement of magnetic properties in two or more defined directions. The inspection probe includes a cup-shaped outer body, a centrally disposed central core, a field generating power coil, a flux coil for measuring magnetic induction and a plurality of field detection elements disposed in various known orientations. In use, the inspection probe of the present invention permits the detection and measurement of anisotropy of material characteristics in at least two directions across the plane of measurement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.