Ultrasonic defect testing method and apparatus
US5475613A · kind A · utility
43Cited by
27References
31Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Dec 17, 1992 |
| Grant date | Dec 12, 1995 |
| Priority date | — |
| Expiry date | Dec 17, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/0289
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A three dimensional object under test is measured to obtain shape data representing a shape of the three dimensional object. The object under test is measured using, for example, an ultrasonic probe LED to obtain defect test data. A processing mechanism forms a three-dimensional graphic image of a defect zone from the defect test data and a three-dimensional graphic image of the object under test from the shape data. A display mechanism is provided for displaying the three-dimensional graphic image of the defect zone superimposed over the three-dimensional graphic image of the object under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.