Patent · US Expired

Method of and apparatus for inspecting a workpiece

US5477446A · kind A · utility

7Cited by
4References
31Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 12, 1993
Grant dateDec 19, 1995
Priority date
Expiry dateMay 12, 2013

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P90/80
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

In a method of and apparatus for inspecting a workpiece, a measuring unit measures basic data for producing an inspection program from each of the workpieces to be inspected, based on measuring conditions and a measuring method both set on a display by a conditions setting unit. Next, a determining method producing unit analyzes the basic data and produces a determining method for determining whether or not each workpiece is faulty. An inspection program producing unit then generates an inspection program based on the set measuring conditions and measuring method and the produced determining method. The inspecting apparatus subsequently automatically inspects each of the workpieces to be inspected as conveyed in a lot based on the inspection program.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.