Patent · US Expired

Integrated circuit metal-oxide-metal capacitor and method of making same

US5479316A · kind A · utility

112Cited by
11References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 24, 1993
Grant dateDec 26, 1995
Priority date
Expiry dateAug 24, 2013

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/435

Abstract

An integrated circuit metal-oxide-metal capacitor and method of making it which involves a support layer; a first conductive electrode on the support layer; a dielectric film on the first conductive electrode; a second conductive electrode disposed on the dielectric film and formed from the first level metallization interconnect layer of the integrated circuit; an interlevel dielectric layer; a first contact via extending through the interlevel dielectric layer and the dielectric film to the first conductive electrode; a second contact via extending through the interlevel dielectric layer to the second conductive electrode; and first and second terminals formed from the second level metallization interconnect layer of the integrated circuit contacting the first and second vias, respectively.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.