Integrated circuit fault testing implementing voltage supply rail pulsing and corresponding instantaneous current response analysis
US5483170A · kind A · utility
16Cited by
13References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 24, 1993 |
| Grant date | Jan 9, 1996 |
| Priority date | — |
| Expiry date | Aug 24, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for detecting faults in digital, analog, and hybrid integrated circuits is disclosed. A single test vector employing bias voltage on input used in conjunction with pulsing the power supply rails is used to allow detection of the various faults which may be present. The instantaneous rail current (i.sub.DD) is then employed for analysis of the circuit, preferably by neural network.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.