Surface resistivity meter for determining surface degradation of high resistivity materials
US5486768A · kind A · utility
3Cited by
9References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 31, 1994 |
| Grant date | Jan 23, 1996 |
| Priority date | — |
| Expiry date | May 31, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/041
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and method for determining the amount of oxidative and hydrolytic degradation in the surface of a highly resistive material, such as a polymer. A special probe provides an annular resistance on the surface of a sample of the material. The voltage drop across the sample determines the input to a meter circuit. A guard circuit has an applied voltage that is substantially the same as the voltage at the meter circuit input. This circuitry permits a very low voltage source to be used.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.