Boundary scan testing using clocked signal
US5487074A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Mar 20, 1995 |
| Grant date | Jan 23, 1996 |
| Priority date | — |
| Expiry date | Mar 20, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31858
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An method and apparatus for testing the frequency characteristics of electrical connections between integrated circuits. The apparatus includes circuitry for transmitting a series of signals via the connection from one integrated circuit to another. Each signal of the series is transmitted at a different frequencies. The apparatus further includes circuitry for receiving the series of signals and generating an error signal for each frequency. The method includes sending the series of pre-determined signals from one integrated circuit to another and receiving the series of signals. The method further including the evaluation of the series of signals and the generation of error signals corresponding to each frequency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.