Patent · US Expired

Buckling beam test probe assembly

US5488314A · kind A · utility

12Cited by

5References

18Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Wolfram Brandt · Sindelfingen, DE
Bernd Marquart · Tailfingen, DE
Roland Stoehr · Nufringen, DE

Key dates

Filing date	Mar 10, 1994
Grant date	Jan 30, 1996
Priority date	—
Expiry date	Mar 10, 2014

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/07357
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A buckling beam test probe assembly for the electrical test of integrated circuit devices is provided having contact probes made of a composite material and a stripper plate constructed so as to allow scrubbing and controllable wiping of the contact probe on the surface of the device to be tested. The assembly is designed for the maximum number of expected contact probes. Only the contact probe compartments which are needed for testing the devices are populated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.