Patent · US Expired

High speed sampling apparatus and method for calibrating the same

US5488369A · kind A · utility

6Cited by
5References
7Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 15, 1988
Grant dateJan 30, 1996
Priority date
Expiry dateJul 15, 2008

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R35/005
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A high speed sampling apparatus based on multiplexed charged coupled devices or sample and hold devices (18) utilises a microprocessor (20) to monitor timing differences between clock signals, each used to clock a respective one of the devices and a reference signal to control a variable timing delay (12, 13, 14) whereby to calibrate each of the devices (18). The control of the variable timing delay (12, 13, 14) is achieved by a digital/analogue converter (15) and additionally, a mark to space ratio control of the variable timing delay is also provided using a digital/analogue converter (16).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.