Patent · US Expired

Semiconductor integrated circuit for outputting data with a high reliability

US5488580A · kind A · utility

10Cited by
7References
9Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 12, 1994
Grant dateJan 30, 1996
Priority date
Expiry dateMay 12, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C7/1024
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A semiconductor integrated memory circuit which extends the time that reliable effective data is output by a data output buffer. The circuit includes a switching device operated by a control signal which is determined according to the states of a row address strobe signal and a column address strobe signal. The switching device is conductive when the column address strobe signal is in an active state, and the switching device is nonconductive when the column address strobe signal is in a precharge state, so that effective data is output by the data output buffer until the column address strobe signal becomes active in the next data read cycle.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.