Off-axis scanning electron beam computed tomography system
US5491734A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 14, 1993 |
| Grant date | Feb 13, 1996 |
| Priority date | — |
| Expiry date | Dec 14, 2013 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J35/24
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A scanning electron beam CT system generates an electron beam along a beam source axis offset from the scanner axis, or axis of symmetry, thereby permitting the X-ray subject to pass completely through the stationary gantry. The electron beam is produced with the first drift tube region of an evacuated housing chamber, and is directed downstream toward a second region that includes a gantry. A scan target and a tuning target, each concentric with and defining a plane normal to the system axis of symmetry, are located in the gantry. A beam optics system, through which the electron beam passes, is located within the housing intermediate the electron gun and gantry. A control system focusses and scans the electron beam upon the scan target, maintaining a beam spot of desired quality. Upon impingement by the scanning beam spot, the scan target emits a fan beam of X-rays. A detector array, concentric with and defining a plane normal to the system axis of symmetry, is located opposite the scan target within the gantry and provides output signals that are computer processed to reconstruct a CT image of a subject placed within the gantry. The scanner axis is preferably above the beam sourc…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.