X-ray diffraction apparatus

US5491738A · kind A · utility

Assignee

• The United States of America as represented by the Administrator of the National Aeronautics and Space Administration · US

Inventors

• David F. Blake · Redwood City, US
• Charles E. Bryson, III · Palo Alto, US
• Friedemann Freund · San Francisco, US

Key dates

• Filing date: Mar 15, 1993
• Grant date: Feb 13, 1996
• Expiry date: Mar 15, 2013

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2223/076
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An x-ray diffraction apparatus for use in analyzing the x-ray diffraction pattern of a sample. The apparatus includes a beam source for generating a collimated x-ray beam having one or more discrete x-ray energies, a holder for holding the sample to be analyzed in the path of the beam, and a charge-coupled device having an array of pixels for detecting, in one or more selected photon energy ranges, x-ray diffraction photons produced by irradiating such a sample with said beam. The CCD is coupled to an output unit which receives input information relating to the energies of photons striking each pixel in the CCD, and constructs the diffraction pattern of photons within a selected energy range striking the CCD.