Patent · US Expired

Integrated optical instrumentation for the diagnostics of parts by embedded or surface attached optical sensors

US5493390A · kind A · utility

119Cited by
3References
9Claims
0Family size

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Key dates

Filing dateAug 23, 1994
Grant dateFeb 20, 1996
Priority date
Expiry dateAug 23, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01D5/35383
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system based on integrated optical technologies for the measurement and diagnostics of physical parameters on whatever structure, by the use of optical sensors, made by the fiber embedded Bragg grating method and by the use of a planar integrated optics device for the analysis of the optical signal. The sensors may be embedded or bonded to the structure, allowing the measurement of parameters like strain and temperature, in either a static or dynamic regime. The system pertains to the technical field of the diagnostics and measurements of mechanical or thermal parameters and to the application field of ground, water and aerospace transportation and also to the application field of construction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.