Patent · US Expired

Method and apparatus for optimizing control of an immobilized film photoreactor

US5494643A · kind A · utility

4Cited by
15References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 4, 1995
Grant dateFeb 27, 1996
Priority date
Expiry dateApr 4, 2015

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S422/906
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

In a photocatalysis system for degrading toxic compounds to constituent components, an improved photoreactor system optimizes reaction rates on the surface of a wide bandgap semiconductor electrode material. The semiconductor material has a first surface exposed to light having a higher energy than the bandgap and a second surface exposed to the toxic compound. An electrical conductor contacts the semiconductor electrode material in a geometry effective to produce an electric field within the semiconductor material. A controlled voltage source is connected to the electrical conductor for applying a voltage bias effective to produce the electric field. A closed circuit current sensor or an open circuit voltage sensor is connected to the electrical conductor and outputs a current or voltage signal, respectively, that is indicative of an excess electrical charge in the semiconductor material. A processor monitors the current or the voltage signal and controls the voltage source to minimize the excess electrical charge.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.