Method and apparatus for characterizing a differential circuit
US5495173A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 5, 1994 |
| Grant date | Feb 27, 1996 |
| Priority date | — |
| Expiry date | Jul 5, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus is provided for characterizing a differential circuit. A measurement system (200) is used to introduce input signals to the differential circuit and to measure corresponding output signals. Particularly, an input differential wave is introduced into the differential circuit (1010) while correspondingly measuring a differential output wave (1020) and a first common mode output wave (1030). Similarly, an input common mode wave is introduced (1040) while measuring a second differential output wave (1050) and a second common mode output wave (1060).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.