Patent · US Expired

Method and apparatus for characterizing a differential circuit

US5495173A · kind A · utility

15Cited by
2References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 5, 1994
Grant dateFeb 27, 1996
Priority date
Expiry dateJul 5, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R27/28
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus is provided for characterizing a differential circuit. A measurement system (200) is used to introduce input signals to the differential circuit and to measure corresponding output signals. Particularly, an input differential wave is introduced into the differential circuit (1010) while correspondingly measuring a differential output wave (1020) and a first common mode output wave (1030). Similarly, an input common mode wave is introduced (1040) while measuring a second differential output wave (1050) and a second common mode output wave (1060).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.