Patent · US Expired

Apparatus and method for calibrating and normalizing a stereolithographic apparatus

US5495328A · kind A · utility

83Cited by
21References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 30, 1993
Grant dateFeb 27, 1996
Priority date
Expiry dateNov 30, 2013

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B2219/49013
  • WIPO fieldOther special machines
  • WIPO sectorMechanical engineering

Abstract

An apparatus and a method for calibrating and normalizing a stereolithographic apparatus so that a reaction means directed by a positioning means supplied with positioning means information may be positioned accurately on a designated surface of a working medium. One or more sensors fixed in location with respect to the designated surface of the working medium are utilized to correlate positioning means information with specific locations on the designated surface of the working medium. Other locations intermediate the specific locations may then be determined by the technique of linear interpolation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.