Method of visualizing minute particles
US5495337A · kind A · utility
48Cited by
7References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 7, 1994 |
| Grant date | Feb 27, 1996 |
| Priority date | — |
| Expiry date | Jan 7, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/309
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The visualization method includes generating a relatively wide beam of light directed onto an object to be inspected and determining the center of intensity of the wide beam of light reflected from the object for facilitating geometric dimensional calculations of a large number of such objects, such as solder deposits on the surface of a printed circuit board, in a very short period of time and in a very accurate manner.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.