Patent · US Expired

Method and system for performing parametric testing of a functional programming interface

US5495571A · kind A · utility

52Cited by
0References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 30, 1992
Grant dateFeb 27, 1996
Priority date
Expiry dateSep 30, 2012

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/3684
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present invention provides a method and system for performing parametric testing of a functional programming interface. Parametric testing of a function verifies that the function performs as expected when a valid or an invalid parameter is passed to the function. To perform parameter testing on a function, the present invention receives as input prototype information for the function, and then formulates a testing plan. The invention tests the function according to the testing plan. The testing plan specifies a list of invalid and valid values for each parameter of the function. The invention repeatedly invokes the function, each time passing the function various combinations of invalid and valid values. The function passes the test when (1) the function does not return an error code for any combination of valid parameter values and (2) the function returns an error for any combination of parameter values that include an invalid parameter value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.