Patent · US Expired

Ion generating source for use in an ion implanter

US5497006A · kind A · utility

82Cited by
6References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 15, 1994
Grant dateMar 5, 1996
Priority date
Expiry dateNov 15, 2014

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/31701
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An ion source embodying the present invention is for use in an ion implanter. The ion source comprises a gas confinement chamber having conductive chamber walls that bound a gas ionization zone. The gas confinement chamber includes an exit opening to allow ions to exit the chamber. A base positions the gas confinement chamber relative to structure for forming an ion beam from ions exiting the gas confinement chamber. A gas supply is in communication with the gas confinement chamber for conducting an ionizable gas into the gas confinement chamber. A cathode is supported by the base and positioned with respect to said gas confinement chamber to emit ionizing electrons into the gas ionization zone. The cathode comprises a tubular conductive body that partially extends into the gas confinement chamber and includes a conductive cap that faces into the gas confinement chamber for emitting ionizing electrons into the gas confinement chamber. A filament is supported by the base at a position inside the tubular conductive body of the cathode for heating the cap and cause the ionizing electrons to be emitted from the cap into the gas confinement chamber.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.