Completely wireless dual-access test fixture
US5500606A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Sep 16, 1993 |
| Grant date | Mar 19, 1996 |
| Priority date | — |
| Expiry date | Sep 16, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07335
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test fixture including top and bottom probe plates including double-ended pogo pins interfacing top and bottom interface printed circuit board (IPCBs), further including double-ended transfer pins to achieve a true wireless dual access test fixture. The top transfer pins electrically engage the bottom transfer pins after vacuum is applied to allow electrical interface with the top-side fixture without the use of wires. The top fixture mounts in a frame assembly through a parallel linkage keeping the top fixture parallel with the PCB under test. Guide pins mounted on the bottom probe plate are used to align a top plate holding the PCB and also to pre-align with bushings on the top fixture before vacuum is applied. When vacuum is applied, the top plate and top fixture move in a single longitudinal direction to electrically engage the test pins and test pads, preventing lateral movement which heretofore caused significant damage to the test pins and test pads.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.