Method for measuring the contour of a surface
US5500737A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 21, 1993 |
| Grant date | Mar 19, 1996 |
| Priority date | — |
| Expiry date | Jul 21, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/521
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring the contour of a surface using a high intensity light source, optics for projecting a line of light on the surface to illuminate a selected contour feature of the surface, an optical detector which generates an image of the selected contour feature, and a processing unit which fits at least one contour segment to the image of the selected contour feature and determines contour characteristics from the contour segment. The method includes a calibration step which corrects for distortion and keystone effect in the image caused by off-axis imaging of the illuminated contour feature by adjusting vertical and horizontal grid lines of an electronically created image with the off-axis image of the contour surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.