Patent · US Expired

Apparatus for magnetic inspection using magnetic shield, with specific relation of distance E between magnetic sensors and distance L between each magnetic sensor and the object to be inspected, to obtain optimum S/N

US5502382A · kind A · utility

5Cited by
10References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 15, 1994
Grant dateMar 26, 1996
Priority date
Expiry dateJul 15, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N27/82
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A magnetic inspection apparatus includes a magnetizer which generates a magnetic field in an object to be inspected, the object running in a predetermined direction, the magnetizer including a pair of magnetic poles provided in facing relation to the object, the pair of magnetic poles being arranged in the predetermined direction; a plurality of magnetic sensors arranged at small intervals in a widthwise direction of the object perpendicular to the predetermined direction, for detecting a leakage magnetic flux due to a defect of the object at locations in the widthwise direction, each magnetic sensor having sides which face the magnetic poles; a plurality of subtraction circuits, each calculating a difference signal between output signals from those ones of the magnetic sensors which are separated by a predetermined distance; a plurality of absolute value circuits, each calculating an absolute value of each difference signal output from each subtraction circuit; and an arithmetic operation circuit which evaluates the defect of the object on the basis of the absolute value signal output from each absolute value circuit, with the relationship between a distance E (unit=mm) between th…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.