Patent · US Expired

Method of detecting defective memory locations in computer system

US5502814A · kind A · utility

22Cited by
1References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 29, 1993
Grant dateMar 26, 1996
Priority date
Expiry dateJun 29, 2013

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/44
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of detecting defective memory locations by determining a slot number corresponding to a memory address, when read data disagree with written data, determining a memory size corresponding to the determined slot number, determining relationships between data bit positions and memory module numbers according to the determined memory size, determining a memory module number as an abnormal memory according to the determined relationships, and specifying the slot number and the memory module number of the abnormal memory. Based on the specified slot number and memory module number, the defective memory module at the slot number can be quickly located and removed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.