Process and device for microwave surface resistance determination

US5506497A · kind A · utility

Assignee

• Forschungszentrum Jülich GmbH · DE

Inventors

• Norbert Klein · Pocking, DE
• Ulrich Dahne · Aachen, DE
• Norbert Tellmann · Remscheid, DE

Key dates

• Filing date: Oct 14, 1993
• Grant date: Apr 9, 1996
• Expiry date: Oct 14, 2013

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y10S505/726
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A process for determining a surface resistance to microwave energy of a superconductive film provides a metallic cavity resonator whose resonator cavity is defined by metallic walls, and positioning a superconductive film whose microwave surface resistance is to be measured as at least part of a wall of the cavity. A dielectric body is applied to a surface of the film and microwave energy is coupled to the cavity through an input antenna and microwave energy is coupled out of the cavity by an output antenna at which signals are produced as a measure of the microwave surface resistance of the film.