Patent · US Expired

System and method for conditioning a radiation detector

US5510626A · kind A · utility

21Cited by
9References
52Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 22, 1994
Grant dateApr 23, 1996
Priority date
Expiry dateJun 22, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03G21/08
  • WIPO fieldEnvironmental technology
  • WIPO sectorChemistry

Abstract

A system and method for conditioning a photoconductive radiation detector achieve charge redistribution within a photoconductive layer without the need for charge removal or charge injection techniques. A first conditioning voltage is applied across the detector to establish a first electric field. The first electric field is reversed relative to fields applied to the detector during image exposure and image read-out operations. While the first conditioning voltage is maintained, the photoconductive layer is exposed for a period of time to first conditioning radiation having one or more wavelengths selected to penetrate at least a portion of the photoconductive layer. A second conditioning voltage, less than the first conditioning voltage, then can be optionally applied across the detector to establish a forward bias electric field. While the second conditioning voltage is maintained, the photoconductive layer is exposed for a period of time to second, broad spectrum conditioning radiation. The detector can then be placed in a dark environment for a period of time, in a shorted condition, to dark-adapt the photoconductive layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.