Patent · US Expired

Method and apparatus for measuring features of a part or item

US5510977A · kind A · utility

156Cited by
24References
32Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 2, 1994
Grant dateApr 23, 1996
Priority date
Expiry dateAug 2, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B5/008
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus for measuring position and orientation of features of a part or item, using a portable coordinate measuring machine (CMM) is presented. A master or standard reference file for the part and its features is generated. Equivalents are manufactured to match the features of the part to be measured. The CMM is positioned within reach of the part. A coordinated system is defined either relative to the part to be measured or to the overall assembly. The equivalent is held in position by an operator. The dimensions of the equivalent and the position of a measurement hole in the equivalent are known and are accounted for by the computer when measurements are taken. The probe of the CMM is used to digitize the position of measurement hole, thereby digitizing that feature of the part. It will be appreciated that all the features of the part for which measurement is desired are digitized in this manner. These digitized positions for each feature are stored in the computer memory and compared to the reference file.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.