Patent · US Expired

Hot grip assembly

US5512727A · kind A · utility

10Cited by
5References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 24, 1994
Grant dateApr 30, 1996
Priority date
Expiry dateMar 24, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0226
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A gripping system for use in uniaxial testing of test specimens at elevated temperatures, typically above 900.degree.-1000.degree. F. The uniaxial mechanical testing is typically tensile testing conducted on high temperature engineering materials which operate under severe conditions at elevated temperatures. The gripping system includes a gripping element having a first section adapted to contact the test specimen wherein a heater is received in the second section for heating the gripping surface. The heater is designed to heat the gripping surface and the test specimen to the desired temperature.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.