Patent · US Expired

Peak current detection in a test instrument for ensuring validity of component test output

US5512841A · kind A · utility

2Cited by
6References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 15, 1994
Grant dateApr 30, 1996
Priority date
Expiry dateSep 15, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2603
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Methods and apparatus are disclosed for using current detection in a test instrument to ensure validity of component test output. In a component test instrument that employs digital synthesis of a test stimulus waveform, voltage scan data and current scan data are successively acquired, the scan data being synchronized relative to the test stimulus waveform. The voltage and current scan data are stored in respective temporary storage buffers. Before displaying the data, a check for an open lead is conducted in a manner similar to a current scan. A zero current value indicates an open lead and the acquired scan data is disqualified from being displayed. Similarly, at the beginning of a component test operation, an open lead test is performed and the first voltage scan is deferred until a validity check confirms that the test leads or probes are in place. The disclosed methods and apparatus ensure that only valid data is displayed to the user.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.