Patent · US Expired

Method of producing PN junction device

US5514620A · kind A · utility

12Cited by
11References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 21, 1994
Grant dateMay 7, 1996
Priority date
Expiry dateMar 21, 2014

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/914
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A PN junction device is formed by removing an inert film from a surface of an N type semiconductor layer to expose an active face, then applying a source gas containing an P type impurity component to the active face to form an impurity adsorption film, and thereafter carrying out a solid-phase diffusion of the impurity is carried out from a diffusion source composed of the P type impurity adsorption film into the N type semiconductor layer to form therein a P type semiconductor layer to thereby provide a PN junction. Lastly, a pair of electrodes are connected to the respective semiconductor layers to form the an PN junction device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.