Low noise light source for forensic examination
US5515162A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 14, 1993 |
| Grant date | May 7, 1996 |
| Priority date | — |
| Expiry date | Jun 14, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/0291
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In accordance with the present invention, a low noise light source for illuminating a treated or untreated deposition of material for forensic examination is disclosed. A light having a wide range of wavelengths is generated. The light is directed toward a reflective diffraction grating. The relative position between an exit slit and the grating is repeatedly adjusted to result in passage through the exit slit of different desired bands of wavelengths of output light from portions of the light reflected by the grating. The output light is directed through a filter, toward the deposition to be examined. The filter has a pass characteristic which substantially passes the desired bands and blocks the light that has a wavelength in an expected range of fluorescence of the deposition.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.