Spectral wavelength discrimination system and method for using
US5515169A · kind A · utility
Assignees
Inventors
Key dates
| Filing date | Oct 13, 1993 |
| Grant date | May 7, 1996 |
| Priority date | — |
| Expiry date | Oct 13, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/0294
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectral wavelength discrimination system and method for using are provided which allows the wavelength of a beam of radiation to be accurately determined using compact inexpensive optics and electronics. The system is particularly useful for identifying the emission wavelength of a multi-component marker system which includes a plurality of components having different wavelength ranges. The system comprises a wavelength selective beamsplitter, termed a Linear Wavelength Filter, that directs predetermined fractions of the beam at each wavelength into each of two output beams. The intensities of these output beams are measured. The measurements and selected system parameters, including the beamsplitter spectral characteristics and the detector sensitivity characteristics are used in a special algorithm for performing Fourier based wavelength-dispersive analysis. The unique solution of the Fourier based analysis is the wavelength of the beam of radiation. The system employs various optical components and structures to achieve the desired spatial resolution and sensitivity. Multiple channel devices and other special configurations are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.