Seismic trace overburden correction method
US5515335A · kind A · utility
15Cited by
7References
5Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 16, 1993 |
| Grant date | May 7, 1996 |
| Priority date | — |
| Expiry date | Aug 16, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V2210/632
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for generating improved displays of seismic data by processing seismic amplitude versus offset data to correct for overburden effects. Analytic traces are calculated for the zero offset reflectivity, A, trace and the amplitude versus offset slope, B, trace of the AVO data. Statistics for the A and B traces within a selected window in time and common depth point space about a selected sample point are calculated. The statistics include root mean square amplitudes of the A and B traces and the correlation coefficient. Desired statistics are selected and used with the measured statistics to correct the A and B traces.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.