Apparatus and method for measuring absolute measurements having two measuring interferometers and a tunable laser

US5521704A · kind A · utility

Inventors

• Jurgen Thiel · Surberg, DE
• Dieter Michel · Traunstein, DE
• Andreas Franz · Ludwigsburg, DE

Key dates

• Filing date: May 2, 1994
• Grant date: May 28, 1996
• Expiry date: May 2, 2014

Classification

• Technology area (CPC G): Physics
• CPC primary: G01B9/02078
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An apparatus and method for measuring absolute measurements having two measuring interferometers and a tunable laser emitting a laser beam. The two measuring interometers each have their own measuring lines and are supplied with the beam from one and the same laser. A reference line is established from the arithmetic sum or difference of the two measuring lines and is maintained at a constant value.