Self calibrating solid state scanner
US5525810A · kind A · utility
32Cited by
26References
45Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 9, 1994 |
| Grant date | Jun 11, 1996 |
| Priority date | — |
| Expiry date | May 9, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06K7/10702
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A solid-state scanner for reading bar codes or projecting images is described. The scanner operates either in a reading mode or a calibrate mode using the same hardware. Use of two-dimensional array light sources minimizes the size of the semiconductor chips containing the light source arrays is provided. Use of oversampling or anamorphic optical systems increase tolerances to angular misorientations is also discussed. Used in conjunction with a mechanical scanning device, the scanner is capable of reading two-dimensional bar codes or generating two-dimensional images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.