Position-marking method for a machine that measures in three dimensions, and apparatus for implementing the method
US5528505A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 19, 1994 |
| Grant date | Jun 18, 1996 |
| Priority date | — |
| Expiry date | Sep 19, 2014 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB25J9/1692
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The contact sensor of the hinged arm of a measurement machine for taking measurements in three dimensions is replaced by a light sensor secured at the same position. A first position-marking axis defined by a light beam emitted by an emitter disposed in a first position is used to determine a first vector by two measured points. The emitter is moved in a plane so as to take up a second position, and a second position-marking axis defined by the light beam of said emitter is used by measuring a point on the second axis. The projection [O.sub.1 ] of the second axis point onto the first position-marking axis is then used to enable a frame of reference [O.sub.1 X, O.sub.1 Y, O.sub.1 Z] to be established. If the machine needs to be displaced in order to take measurements in a zone that is further away, a new frame of reference is determined using the same steps, using the same first axis and using a new point on another second axis that is obtained by a new displacement of the emitter performed so that it remains in the same plane, thereby enabling the origin [O.sub.2 ] of the new frame of reference to be determined, thus making it possible to make available a plurality of known frames …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.