Circuit and method for testing a dithered analog-to-digital converter
US5530442A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 9, 1994 |
| Grant date | Jun 25, 1996 |
| Priority date | — |
| Expiry date | May 9, 2014 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M3/458
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A device comprises: an analog-to-digital converter; a digital signal processor; a digital dither signal generator; and a signal coupling device adapted to selectively couple one of the dither signal generator and the digital signal processor to the signal path in the converter. A method of testing a dithered analog-to-digital converter employing an M-bit digital signal generator, M being a positive integer, comprises the steps of: generating an M-bit, periodic signal; providing the generated signal to the dithered converter at a point along the signal path of the dithered converter in place of the dither signal; and measuring the digital output signal produced by the converter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.