Patent · US Expired

Method and apparatus for aligning optical elements and testing aspheric optical components

US5530547A · kind A · utility

59Cited by
3References
27Claims
0Family size

Inventor

Key dates

Filing dateAug 4, 1994
Grant dateJun 25, 1996
Priority date
Expiry dateAug 4, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03H2001/0072
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention is directed to an apparatus for aligning optical elements and a method used to test aspheric components using a conventional interferometer. The apparatus comprises an optical mount having a base and a mount plate used for adjustably mounting an optical element. The mount plate is adjustable relative to the base and includes an assembly surface and several side surfaces. The base is attachable to a bench, table, rail, or the like. An optical element, such as a pre-aligned alignment CGH, is positioned within a first frame, which in turn is releasably coupled to the mount plate. The interferometer generates a spherical test beam which is diffracted by the reflective alignment CGH to create an interferogram. The mount plate is adjusted relative to the base to diffract the test beam onto itself, thus producing null interference fringes. The alignment CGH is removed from the mount plate and a second optical element, such as a CGH null compensator fixed to a second frame, is releasably coupled to the mount plate in place of the alignment CGH, without adjusting the position of the mount plate, such that the spherical test beam from the interferometer is diffracted as…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.