Automatic garment inspection and measurement system
US5530652A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 11, 1993 |
| Grant date | Jun 25, 1996 |
| Priority date | — |
| Expiry date | Aug 11, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30196
- WIPO fieldTextile and paper machines
- WIPO sectorMechanical engineering
Abstract
An automatic garment inspection and measurement system can create a two-dimensional or three-dimensional electronic representation of an object. This electronic representation can then be combined with other electronic representations to create a database of measurements from which standard patterns can be generated for use in manufacturing garments. The electronic representation can also be used to compare the manufactured object it represents to an ideal representation in order to determine if the object's measurements are within a predetermined tolerance of the ideal representation. A machine vision system is used to capture an image of the object and convert that image into a digital representation which can then be added to a database to be used to compile an ideal pattern or can be compared to an already existing ideal image to determine if the object is the correct size.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.