Method of optical inspection
US5532817A · kind A · utility
4Cited by
12References
1Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 3, 1994 |
| Grant date | Jul 2, 1996 |
| Priority date | — |
| Expiry date | Oct 3, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/646
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining the configuration of a resin portion of an article comprising exposing the article to a light source at a first wavelength and measuring emission of light at a second, different wavelength; wherein the resin contains a moiety containing a structure of the formula: ##STR1## or a moiety which is a reaction product of said moiety in a quantity sufficient to impart fluorescent properties to said resin.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.