Patent · US Expired

Built-in self-test global clock drive architecture

US5533032A · kind A · utility

21Cited by
9References
9Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 28, 1991
Grant dateJul 2, 1996
Priority date—
Expiry dateOct 28, 2011

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318552
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A BIST clock driver for providing memory elements in a combinational and sequential logic circuit with a global clock signal during user mode and a test clock signal during testing. The clock driver also supplies clock signals to memory circuits that have clock inputs supplied by random logic. The clock driver supplies the random logic with a global clock signal. A clock multiplexor receives the generated clock and the test clock signal and provides the memory element with the generated clock signal during user mode and the test clock during testing of the memory element.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.