Circuits, systems and methods for testing integrated circuit devices including logic and memory circuitry
US5535165A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 30, 1995 |
| Grant date | Jul 9, 1996 |
| Priority date | — |
| Expiry date | Jun 30, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2733
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A single chip integrated circuit 200 is disclosed which includes logic circuitry 202, memory circuitry 204, and a bus 300. First bus control circuitry 302 controls the exchange of signals between logic circuitry 202 and bus 300. Second bus control circuitry 303 controls the exchange of signals between memory circuitry 204 and bus 300. Third bus control circuitry 306 is included which controls the exchange of signals between bus 300 and at least one test pin 206. Mode control circuitry 205 is operable as control circuitry 302, 303, and 306. In the operating mode, mode control circuitry 205 activates first bus control circuitry 302 and second bus control circuitry 303. In a memory test mode, mode control circuitry 205 activates second bus control circuitry 303 and third bus control circuitry 306 and deactivates first bus control circuitry 302. In a logic test mode, test mode circuitry 205 activates first bus control circuitry 302 and third bus control circuitry 306 and deactivates second bus control circuitry 303.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.