Patent · US Expired

Polysilicon fuse array structure for integrated circuits

US5536968A · kind A · utility

119Cited by
2References
13Claims
0Family size

Assignees

Inventors

Key dates

Filing dateAug 16, 1994
Grant dateJul 16, 1996
Priority date
Expiry dateAug 16, 2014

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A programmable read only memory (PROM) including an array of polysilicon fuse elements. The fuse array is formed within a semiconductor substrate including first and second patterned signal layers electrically insulated from one another. Each polysilicon fuse element within the array connects a first electrical conductor residing in the first patterned signal layer with a second electrical conductor residing in the second patterned signal layer. The polysilicon fuse element is in the form of a narrow strip and is folded in order to cause a current flowing through the clement to crowd, lowering the amount of current required to heat the fuse element to its melting point, i.e. the threshold current. The PROM is programmed by passing a threshold current through selected fuse elements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.