Method for testing an on-off function of semiconductor devices which have an isolated terminal
US5537054A · kind A · utility
20Cited by
2References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 10, 1986 |
| Grant date | Jul 16, 1996 |
| Priority date | — |
| Expiry date | Mar 10, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G3/006
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A testing method is provided for a semiconductor device which includes a control terminal and a pair of main terminals wherein one of the main terminals is isolated from the outside by a dielectric. First, a voltage which changes with time is applied to the isolated main terminal through the dielectric. A control signal which controls conduction and non-conduction of the semiconductor device is the applied to the control terminal. Following this, the test is made by detecting a displacement current flowing through at least one of the two main terminals and the control terminal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.