Particle sampling system for gas supply system
US5537879A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 2, 1995 |
| Grant date | Jul 23, 1996 |
| Priority date | — |
| Expiry date | Aug 2, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2001/225
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A particle sampling system which includes a flow restrictor positioned in a conduit between a vent and an analyzer probe and restricts flow in the conduit to maintain an overpressure of sample gas at the counter probe which, in turn, forces the gas sample into the particle analyzer. The system further includes a reservoir for holding a working fluid usable with a particle analyzer and a pressurized gas source which is used to pressurize the reservoir to enable supply of the working fluid against the pressure of the gas analysis sample and to provide a purge gas for the analyzer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.