Crack monitoring apparatus
US5539656A · kind A · utility
20Cited by
10References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 11, 1994 |
| Grant date | Jul 23, 1996 |
| Priority date | — |
| Expiry date | Oct 11, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0647
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for monitoring the growth of surface cracks in materials includes a means for applying a load to a specimen to simulate actual use of the specimen, means for illuminating the specimen, means for capturing images of the specimen, and means for processing the images to monitor crack growth in the specimen. Optionally, the means for processing can be used to control the other means.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.