Patent · US Expired

Semiconductor memory device and method for reading and writing data therein

US5539691A · kind A · utility

18Cited by
5References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 5, 1995
Grant dateJul 23, 1996
Priority date
Expiry dateJun 5, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C7/1051
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An NAND gate for outputting an output establishment detection signal in response to the fact that a complementary output of a latch type sense amplifier has been established is provided. When a tristate buffer is activated by signal, a word line which has been in a selected state is rendered non-selected state. Accordingly, current can be prevented from leaking from a power supply line to a ground line in tristate buffer. In addition, column current Ic flowing through memory cells can be minimized in response to the fact that word line has been set to a selected state.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.