Array tester for determining contact quality and line integrity in a TFT/LCD
US5546013A · kind A · utility
41Cited by
13References
4Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 5, 1993 |
| Grant date | Aug 13, 1996 |
| Priority date | — |
| Expiry date | Mar 5, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/136254
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An apparatus for testing for and classifying defects in a TFT/LCD array having gate lines and data lines. Devices are provided for activating cells of the array by applying gate pulses to the gate lines and pulses to the data lines. Devices are also provided for acquiring waveforms from data lines of the array. Additional devices sample the waveforms at selected points in time. A computer may be used to classify the waveforms to indicate whether defects are present and if present, the nature of the defects by comparing voltages of the waveform at the selected points in time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.