Patent · US Expired

Apparatus and method for binocular measurement system

US5546808A · kind A · utility

7Cited by
30References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 6, 1994
Grant dateAug 20, 1996
Priority date
Expiry dateSep 6, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/0691
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus and method are disclosed wherein a linear array of electromagnetic radiation emitting devices are arranged in association with a moving workpiece. Electromagnetic radiation emitted by the array is received by two or more receivers. Several non-contact measurements may be obtained on a workpiece using the present apparatus and methods.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.